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General/Multiple Products
BELOW ARE YOUR SEARCH RESULTS:
AMRAY 1830 + EDX - Motivated for immediate sale!
SEM features: SEI/BEI detectors Tungsten or LaB6 Filament Sample size to 4” diameter Accelerating Voltage: 0-30kV Sample stage Motion: X & Y: 100 mm Z: 52 mm Tilt: 0 to 90 degrees Rotation: 360 degrees continuous Original Image Resolution
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=419423
created on: Fri, 30 Jul 2010 16:13:12 GMT
Video control board for Hitachi S-2700 SEM Wanted
Video control board for Hitachi S-2700 SEM I am looking for the video control circuit board (output for the analog monitor). The part number is S-6509 535-9909. I am also interested in the (green) analog monitor and other circuit boards o
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=419056
created on: Mon, 26 Jul 2010 21:35:47 GMT
Used Hitachi S-8840 Scanning Electron Microscope
Used Hitachi S-8840 Scanning Electron Microscope For Sale Surface Inspection System For Sale Scanning Electron Microscope Hitachi S8840 CD SEM System. Production CD-SEM,
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=387012
created on: Thu, 15 Jul 2010 20:54:37 GMT
LEO 440 SEM with Thermo Electron EDS
LEO 440 SEM including EDS system, both 1994 vintage. SEM includes a brand new (re-furbished, fewer than 50 hours of service) turbo pump; SE & BSE detectors; ion pump for LaB6 operation; multiple sampling accessories. SEM presently is not fully functiona
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417881
created on: Fri, 09 Jul 2010 18:41:11 GMT
Used Hitachi S-7000 Critical Dimension SEM
Used Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM) For Sale item 10040
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=404719
created on: Thu, 08 Jul 2010 15:42:00 GMT
Used JEOL JWS 7700 FE SEM Inspection & Metrology S
Used JEOL JWS 7700 FE SEM Inspection & Metrology System For Sale
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=404588
created on: Thu, 08 Jul 2010 13:33:06 GMT
Used Hitachi S-4500 SEM Cold Field Emmission SEM S
Used Hitachi S-4500 SEM Cold Field Emmission Scanning Electron Microscope System For Sale Item number 2802
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=404587
created on: Thu, 08 Jul 2010 13:33:02 GMT
2009 FEI Nova 600i DualBeam
This Nova 600i system is fully prepared for inspection and custom configuration. The 600i is equipped with the Sidewinder Ion Column, and high resolution SFEG Electron Column. Up to 5 GIS may be installed. How can we configure this system for you?
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417654
created on: Tue, 06 Jul 2010 22:22:01 GMT
New 2008 Zeiss EVO 50 HV SEM
Brand new in the crate 2008 Zeiss EVO 50HV SEM available for immediate delivery. Picture is a sister system, ready for demonstration. Click this link for product info: http://www.zeiss.es/c12568ef003df8fe/Contents-Frame/b4ed754e25809070c125705b0035
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417653
created on: Tue, 06 Jul 2010 22:17:12 GMT
FEI Nova Nano 630 ESEM
New in April, 2009. Variable pressure, large chamber, Schottky Field emission SEM. Windows 7 and Windows XP OS. 1.6 nm at 1KV 50 v - 30KV operation IR Camera Dry pumped (scroll, turbo) vacuum system.
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417364
created on: Thu, 01 Jul 2010 16:30:31 GMT
Hitachi S-4700-II FESEM
Excellent condition. S-4700-II large chamber FESEM. 0.5 - 30KV 1. nm resolution at 15KV Type II stage: X: 0-100 mm Y:0-50 mm traversal. Windows XP upgradable. fully refurbished.
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417360
created on: Thu, 01 Jul 2010 16:17:39 GMT
Hitachi TM-1000
Excellent condition. 2008 vintage. Windows XP operating system. 15KV accelerating voltage. 20 x -10,0000 X magnification. 15mm x 18 mm stage traversal. Drypump Low vacuum system. approx weight 87 kg.
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417358
created on: Thu, 01 Jul 2010 16:02:49 GMT
Looking for JEOL 2000EX/FX TEM
Hi. I'm looking to purchase a JEOL 2000EX/FX TEM, or any parts for this microscope. Please contact using the form below. Thanks.
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417334
created on: Wed, 30 Jun 2010 23:27:48 GMT
Used Hitachi S-450 Scanning Electron Microscope
Used Hitachi S-450 Scanning Electron Microscope For Sale Easy to Maintain W Electron Source, X,Y, Z, Tilt & Theta Manual Stage Positioning, 100mm Dia. Sample when proper mount is used, Easy
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=385940
created on: Wed, 30 Jun 2010 21:01:17 GMT
FEI XL 40 (Lab 6) Electron Microscope
FEI XL 40 SEM (Lab 6) • Originally installed 1996 (Dupont, Richmond, VA) • Serial Number D717 • LaB6 source with 6-position bias control • Windows NT • MCtrl version 6.0 • Fully integrated image storage • ET type Secondary Electron Detector • FEI (Phi
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417001
created on: Sun, 27 Jun 2010 19:30:50 GMT
Zeiss 1455VP with PGT EDX Electron Microscope
• Originally installed late 2001 • Serial Number 1450-0024 • Tungsten Filament • Windows NT • Integrated image capture software • Everhart Thornley SE detector • Variable Pressure SE detector • KE Backscatter detector • Chamberscope • PGT Prism 2000 ED
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=417000
created on: Sun, 27 Jun 2010 19:30:04 GMT
Hitachi S 4500 Field Emission Electron Microscope
PRICE REDUCED NOW FULLY OPERATIONAL AND READY TO DEMO Hitachi S 4500 Field Emission Electron Microscope complete with PGT EDX. …all in Pristine condition. Performance Specs • 1.5nm at 30kV; 5nm at 1kV • Magnification range: 20x to 500,000x • A
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=416999
created on: Sun, 27 Jun 2010 19:29:23 GMT
Used Hitachi S-4500 SEM Cold Field Emission SEM
Used Hitachi S-4500 SEM Cold Field Emission SEM System For Sale Item 2491
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=398066
created on: Fri, 25 Jun 2010 20:36:32 GMT
2002 XL 30 TMP Scanning Electron Microscope
Immaculate XL 30 TMP scanning electron microscope available for purchase. Refurbished and upgraded. Available for testing and demonstration. Please advise of your technical requirements, we can custom configure to your specifications. In fact, come
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=416461
created on: Mon, 21 Jun 2010 23:11:19 GMT
Philips CM10 Transmission Electron Microscope TEM
Used Philips CM-10 Transmission Electron Microscope (TEM) For Sale 100KV, LAB6 OR W, HIGH CONTRAST OBJECTIVE LENS, 200 MICR
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=391404
created on: Fri, 18 Jun 2010 19:17:31 GMT
Used Scanning Electron Microscopes from SEMTech
The Right SEM at the Right Price!
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=416259
created on: Fri, 18 Jun 2010 18:37:03 GMT
Used Applied Materials Semvision G2 FIB SEM
Used Applied Materials Semvision G2 FIB Scanning Electron Microscope For Sale Process Technology: SEM & FIB Make: AMAT - Applied Materials Model: Semvision G2 FIB Wafer Size:
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=383807
created on: Fri, 11 Jun 2010 17:44:16 GMT
SEM with EDS System and Video Capture
This is an SEM located in Ireland, offered for sale with PC and video facility. Model: JEOL T220A Scanning Electron Microscope (SEM), Kevex Energy Dispersive X-ray Spectroscopy (EDS) system, and Dell Optiplex PC used to digitally capture the SEM image/p
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=415497
created on: Tue, 08 Jun 2010 16:33:15 GMT
Used Applied Materials Semvision G2 FIB
Used Applied Materials SEMVision For Sale - Wafer size 200 mm and 300 mm - Automatic Dual-beam Integrated Defect Review and Classification SEM w/integrated Focus Ion-beam
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=383306
created on: Fri, 04 Jun 2010 15:18:57 GMT
Used Applied Materials SEM Vision CX SEM
Used Applied Materials SEM Vision CX SEM For Sale Process Technology: Make: Applied Materials Model: SEM Vision CX SEM Serial #: Wafer Size: Part #: Mfg Year:
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=383305
created on: Fri, 04 Jun 2010 15:15:07 GMT
Used JEOL JWS-7515 Electron Microscope Wafer Insp
Used JEOL JWS-7515 In-Line Wafer Inspection Electron Microscope For Sale Inventory#: 49809
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=396574
created on: Fri, 04 Jun 2010 14:12:03 GMT
Used HITACHI S-806C Wafer Inspection SEM
Used Hitachi S-806C Wafer Inspection Field Emission SEM For Sale Inventory#: 36721
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=396573
created on: Fri, 04 Jun 2010 14:08:16 GMT
High voltage system of LEO 912
I'm looking for high voltage system for microscope of LEO 912,I know this modle is out of production,if new model's power system can use on LEO 912,it is ok
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=415034
created on: Wed, 02 Jun 2010 15:04:58 GMT
JEOL TEM wanted
Looking for JEOL 100CXII. Any condition or configuration. May be interested in other models too.
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=415022
created on: Wed, 02 Jun 2010 14:06:24 GMT
Zeiss SEM Supra 55VP scanning electron microscope
Loaded system: Includes Schottky FESEM with Gemini column, specimen interlock, EDAX Apollo 40 SDD EDS, TSL EBSD, Denton Desk IV TSC fine grain sputter coater, Robinson 8.2 scintillator motorized BSE with joystick control unit, STEM, VPSE detector, CL in h
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=415010
created on: Wed, 02 Jun 2010 01:34:33 GMT
Used FEI Model FIB 800 SEM
Used FEI Model FIB 800 SEM For Sale - Scanning Electron Microscope FIB800
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=402163
created on: Wed, 26 May 2010 14:52:54 GMT
WDS Crystals- TMPJ, PETJ & LIF w/inspection certs
These are unused and have never been touched except for me to take the pictures. If you need more pictures let me know and I will take them. These were originally purchased for use with a JEOL JXA 840 but the instrument has been decommisioned. I am not
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=414400
created on: Sat, 22 May 2010 01:10:17 GMT
SEMTech Solution’s Maintenance & Repairs Services
SEMTech Solution’s service contracts offer co
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=409001
created on: Thu, 20 May 2010 13:00:00 GMT
Used Hitachi S-7000 Scanning Electron Microscope
Used Hitachi S-7000 Critical Dimension Scanning Electron Microscope (CD SEM) For Sale
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=381778
created on: Fri, 14 May 2010 20:41:43 GMT
Zeiss Electron Microscope EN-10-CA, Used
One Used Ziess Electron Microscope model EN-10-CA. This item came from a state owned lab that was being demolished, We do not have the knowledge or ability to test this at all. We are selling it As-Is with all the parts that came with it. This also came w
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=413854
created on: Thu, 13 May 2010 20:40:08 GMT
CD-SEM/SEM/FIB--Hitachi CD-SEM model S-8840, S9300
We provide high quality, used, 2nd hand, rebuilt and refurbished CD-SEM. FESEM, SEM, and FIB.(SEM Image Digitizer System.Schottky Field Emission Filaments for CD-SEM equipment). Our equipment is fully reconditioned to meet or exceed OEM specifications
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=413033
created on: Sun, 02 May 2010 20:48:58 GMT
Phenom Desktop Scanning Electron Microscope
Phenom: Your personal electron microscope Phenom™ is a plug-and-play high-resolutio
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=389990
created on: Tue, 01 Dec 2009 00:56:42 GMT
New TEM Window Array Devices from Norcada
Norcada TEM Window Arrays Enable Multiple In-Situ Analysis
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=389949
created on: Fri, 27 Nov 2009 17:49:25 GMT
Fibermetric™ System Powered by Phenom™ SEM
Faster, Better, Easier Fiber Analysis with the Fibermetric™ System powered by Phenom™
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=390952
created on: Fri, 27 Nov 2009 14:13:52 GMT
New! FEI's Magellan™ XHR SEM
The Newest Family of Scanning Electron Microscopes from FEI Company!
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=385310
created on: Fri, 27 Nov 2009 13:25:55 GMT
New Phenom™ SEM Remote Assistant
Remote Assistant is Now Available for FEI’s Phenom Personal SEM
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=394145
created on: Tue, 27 Oct 2009 14:32:47 GMT
New Silicon Drift Detectors from Thermo Fisher
Thermo Fisher Scientific Unveils New Silicon Drift Detectors with
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=331341
created on: Fri, 10 Aug 2007 18:03:24 GMT
Introducing the V600 FIB by FEI
Introducing the V600 Family The FEI V600FIB is the most efficient, flexible, and cost-effective circuit edit tool available for semiconductor labs. It enables fast, versatile modification and analysis with a single-col
http://www.labx.com/v2/adsearch/detail3.cfm?rssfeed=2&adnumb=323462
created on: Wed, 09 May 2007 19:30:48 GMT
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